Each sub-segment in the test and measurement space is characterized by a different set of trends and dynamics:
- The communications test sub-segment is largely driven by spending in the telecom equipment market and the customers are challenged with creating testing solutions to test ever-evolving standards.
- The automated test equipment (ATE)/semiconductor test sub-segment is driven by three major factors: ATE test equipment utilization rates, chip volumes being shipped, and the future market sentiments of integrated device manufacturers.
- The general-purpose test sub-segment contains a more diverse set of equipment and therefore responds to more general economy fluctuations.
