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Home > Support > Devices > Programming Tools > In-Circuit Testers Print This Page Subscribe to Email In-Circuit Testers Altera's MAX® II, MAX 3000A, MAX 7000S, MAX 7000A, and MAX 7000B devices support in-system programming (ISP) with in-circuit test (ICT) equipment, offering significant time and cost benefits by integrating programmable logic devices (PLDs) into board-level testing. ISP via in-circuit testers is accomplished with either an adaptive or constant algorithm. An adaptive algorithm reads information from a device and adapts subsequent programming steps to achieve the fastest possible programming time for that specific device. A constant algorithm uses a pre-defined (non-adaptive) programming sequence. Some tester platforms are well-suited to support adaptive algorithms while others are not. MAX II, MAX 3000A and MAX 7000 devices can use adaptive or constant algorithms and work with either tester platform. Related Documents AN 39: IEEE 1149.1 (JTAG) Boundary-Scan Testing in Altera Devices AN 100: In-System Programmability Guidelines Using the Agilent 3070 Tester for In-System Programming chapter of the MAX II Handbook. AN 109: Using the HP 3070 Tester for In-System Programming Related Links In-Circuit Testers Vendor Support IEEE 1532 Programming Jam Standard Test and Programming Language (STAPL) Jam STAPL Vendor Support Boundary-Scan Tools Boundary-Scan Tools Vendor Support Rate This Page

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