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Test & Measurement
Automated Test Equipment
High-performance, low-latency FPGAs for semiconductor, display, image sensor, SoC and memory ATE.
Precision Testing at Speed
Altera FPGAs deliver high-performance, low-latency processing for modern ATE systems used across semiconductor, memory, and consumer electronics industries, with support for high-speed I/O, flexible timing control, and dense logic resources.
FPGAs implement pattern generation, pin-level timing, data capture, and real-time decision-making in production and validation testers, and their reconfigurability enables multi-product test platforms that adapt as device specifications evolve.
The Challenges, and Why FPGA
The Challenge
Pin-Accurate Timing
Semiconductor and SoC testing needs precise, jitter-free timing across many pins.
Why FPGA
Deterministic Timing Control
PHY Lite IO delay enables testing source-synchronous parallel interfaces where programmable timing margin and high pin throughput are important.
The Challenge
Multi-Product Test Platforms
Device specifications evolve faster than fixed-function testers can follow.
Why FPGA
Reconfigurable Test Logic
Support multiple product families and evolving specs with a single hardware platform.
The Challenge
High-Resolution Interface Testing
Display testers offer MIPI, LVDS, HDMI, and DisplayPort validation for DUT testing.
Why FPGA
Embedded Video Processing IP
Built-in video IP supports pattern generation and frame validation for these standards.
Why Altera
High-Speed SerDes & Programmable I/O
Emulate protocol and interface behavior for digital, mixed-signal, and SoC testing.
Deterministic Clocking
Precision timing and clocking support tight test cycles across pin counts.
Built-In DSP & Memory
Real-time pattern comparison and error analysis run in hardware, not software.
High-Speed Transceivers & Protocol IP
Test NVMe, PCIe, and SATA compliance, latency, and throughput under real workloads.
Get Started
More Test & Measurement Applications
Digital & RF Testers
Real-time signal processing FPGAs for oscilloscopes, spectrum analyzers, and RF testers.
Communication Testers
FPGAs for 800GE, PCIe, and 5G/6G test platforms with real-time signal processing.
Automotive Testers
Flexible FPGAs for in-vehicle network, ADAS, and ECU testing platforms.
Common Questions
FPGAs generate patterns, capture device responses and compare results through parallel hardware paths. Programmable I/O and timing logic coordinate test cycles across multiple pins, supporting semiconductor, memory and SoC production or validation testing while allowing the test functions to be adapted as device specifications change.
Programmable I/O delay allows interface timing to be adjusted for source-synchronous parallel testing. PHY Lite provides this capability for designs that need programmable timing margin and high pin throughput, complementing pattern generation and response capture in the ATE signal path. Explore PHY Lite programmable I/O timing
Reconfigurable test logic is useful when a platform must test multiple product families or adapt to changing device specifications. FPGA patterns, interface behavior and comparison functions can be revised on the same hardware platform, within its available I/O, logic and timing resources.
An FPGA tester can combine pattern generation, frame validation and real-time video comparison with the required interface logic. MIPI, LVDS, HDMI and DisplayPort are relevant to the camera and display applications, with the chosen interface implementation matched to the device under test.
Storage testing combines high-speed transceivers with the protocol controller implementation required by the selected interface. Supported hard IP or soft controller IP can provide those functions, allowing tester logic to examine compliance, latency and throughput for the storage device under test. Explore PCIe protocol IP and implementation resources