From high-speed data acquisition to complex signal processing, Altera FPGAs power innovation in the most demanding Test & Measurement applications. Our devices offer ultra-low latency, flexible I/O, and scalable performance to help engineers build faster, smarter instruments. Whether you're designing ATE systems, RF testers, or protocol analyzers, Altera enables the precision and adaptability you need. Explore how our FPGA portfolio can meet the evolving demands of your T&M solutions.
Altera FPGAs enable real-time responsiveness critical for high-speed digital and RF test systems. Their low latency, parallelism, and precision timing ensure accurate measurements and reliable stimulus-response cycles in every test scenario.
With support for a wide range of voltage levels, transceiver speeds, and interface protocols, Altera FPGAs allow engineers to build reconfigurable platforms that adapt easily to new industry standards, custom buses, or legacy interfaces—all on a single hardware platform.
By consolidating DSP blocks, embedded memory, and custom IP, Altera FPGAs allow designers to accelerate signal processing, reduce system complexity, and fit more capability into less space. This leads to faster data paths, lower BOM cost, and more scalable T&M platform
Altera FPGAs deliver high-performance, low-latency processing for next-generation ATE systems used across semiconductor, storage, and consumer electronics industries. With support for high-speed I/O, flexible timing control, and dense logic resources, FPGAs are ideal for implementing pattern generation, pin-level timing, data capture, and real-time decision-making in production and validation testers. Their reconfigurability also enables support for multi-product test platforms and evolving device specifications.
Altera FPGAs enable pin-accurate timing, pattern generation, and real-time response needed in modern semiconductor ATEs. Their logic density and reconfigurable architecture support high-speed testing of digital ICs, analog front ends, and advanced SoCs.
With flexible I/O and embedded video processing IP, Altera FPGAs support high-resolution pattern generation, frame validation, and interface testing for MIPI and LVDS standards—ideal for camera modules in a multitude of applications of camera sensor devices.
Altera FPGAs are integral components in USB 3.2 testers, facilitating the validation and testing of USB 3.2 interfaces. These testers utilize Altera's FPGA technology to ensure compliance with USB 3.2 specifications, providing high-speed data transfer capabilities and enabling thorough testing of USB 3.2 devices for optimal performance and reliability.
With adaptable I/O and integrated video processing IP, Altera FPGAs enable high-resolution pattern generation, frame verification, and interface testing across MIPI, LVDS, HDMI, and DisplayPort standards—ideal for validating camera modules and display systems in diverse end applications.
Altera FPGAs deliver the real-time signal processing, precision timing, and high-speed data handling required in today’s advanced digital and RF test equipment. Whether capturing waveforms, analyzing spectra, or generating test signals, FPGAs provide the low latency, parallel compute, and reconfigurability essential for instruments operating from baseband to mmWave. Their integration of DSP, memory, and configurable I/O makes them ideal for prototyping, production test, and high-end lab-grade analyzers.
Altera FPGAs bring real-time waveform capture, fast triggering, and responsive display updates to portable oscilloscopes. Their parallel architecture supports deep memory buffering and multi-channel signal analysis, enabling engineers to visualize high-speed signals on compact, battery-powered instruments. With low power consumption and flexible I/O, Altera FPGAs are ideal for enabling field-ready oscilloscopes without compromising performance.
Altera FPGAs enable GHz-range oscilloscopes to deliver high-speed waveform acquisition, deep memory capture, and real-time analysis for RF signals. With integrated multi-Gbps PAM4 transceivers with PCIe & memory support, fast DSP blocks, and precision timing control, FPGAs support advanced features like trigger conditioning, spectral analysis, and protocol decoding. Ideal for R&D labs and production test environments, they provide the flexibility and performance needed to visualize and characterize fast-changing RF waveforms across wireless, radar, and high-speed digital domains.
Altera FPGAs are at the core of high-performance test platforms targeting today’s most advanced communication technologies. With built-in DSP, high-speed transceivers, and flexible logic, Altera devices enable real-time signal capture, modulation analysis, protocol decoding, and jitter measurement for RF and high-speed digital interfaces. Whether validating next-gen wireless standards or exercising multi-gigabit serial links, FPGAs provide the speed, accuracy, and reconfigurability needed for modern test instrumentation.
Altera FPGAs power the next generation of high-speed Ethernet testers, enabling real-time traffic generation, error injection, and protocol validation at 400GE and 800GE line rates. With hardened Ethernet IP, multi-rate transceivers up to 116 Gbps, and integrated PCS/PMA support, Altera devices deliver the performance and flexibility needed to validate physical and MAC layers, stress-test switching infrastructure, and ensure compliance with evolving IEEE standards. Ideal for lab and production environments, they help accelerate development and deployment of ultra-high-speed networking systems.
The PCIe Tester leverages Altera's Agilex series FPGA to provide comprehensive testing capabilities for PCIe interfaces. With its high-performance FPGA fabric, the tester offers robust functionality for analyzing and validating PCIe communication, ensuring compliance with industry standards. Its flexibility and scalability make it an ideal solution for testing various PCIe configurations and optimizing performance in diverse applications.
Altera FPGAs enable advanced 5G and emerging 6G test platforms with real-time processing, low-latency signal paths, and support for massive bandwidths across sub-6 GHz and mmWave spectrums. With integrated DSP blocks, high-speed SerDes, and support for beamforming, MIMO, and IQ modulation, Altera devices are ideal for validating baseband and RF performance, protocol compliance, and end-to-end system behavior. Their reprogrammability ensures adaptability to evolving 3GPP standards, making them essential for next-gen wireless infrastructure testing.
Altera Programmable Acceleration Cards (PACs) with Altera FPGAs provide a powerful foundation for testing and emulating Open RAN (xRAN) architectures. With flexible logic, embedded DSP, and high-speed transceivers, they enable real-time processing of fronthaul protocols such as eCPRI and RoE. Ideal for Layer 1 offload, traffic shaping, and protocol validation, PAC-based platforms allow engineers to test DU/CU interoperability, timing synchronization, and network slicing under realistic load conditions. Altera FPGAs ensure adaptability as xRAN standards evolve.
Altera FPGAs power flexible and future-ready platforms for testing in-vehicle systems. From validating ECUs and ADAS sensors to exercising automotive networking protocols like CAN, LIN, FlexRay, and Automotive Ethernet, FPGAs enable real-time, deterministic testing across a wide range of conditions. Their reprogrammability allows rapid adaptation to changing standards, while high-speed I/Os and embedded processing ensure accurate signal generation, fault injection, and data capture for end-of-line, R&D, and compliance testing
Altera FPGAs power flexible, high-performance testers for in-vehicle networks, enabling real-time validation of protocols like CAN, LIN, FlexRay, and Automotive Ethernet. With multi-voltage I/O support, precise timing control, and reconfigurable logic, Altera devices allow engineers to emulate ECUs, inject faults, and monitor traffic under varying load and environmental conditions. Ideal for R&D and end-of-line testing, Altera-based solutions adapt easily to evolving automotive standards and long product lifecycles.